发明名称 CHARACTERISTIC MEASURING METHOD OF ELECTRONIC COMPONENT, AND CHARACTERISTIC MEASURING DEVICE USED THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a measuring method capable of positioning by allowing a measuring piece to abut on an external electrode of an electronic component easily and surely, and measuring a characteristic with stable and high accuracy, even in the case of a small-sized electronic component having the size of 1005 or smaller, by a simple position adjustment of the measuring piece, and also to provide a characteristic measuring device used therefor. SOLUTION: This characteristic measuring device includes a conveyance means 13 for conveying and positioning the electronic component 12 equipped with an external electrode 11 having ridged parts 11g, 11h; a measuring terminal 17 arranged over the electronic component 12, and abutting on the external electrode 11; and a measuring device connected to the measuring terminal 17, for measuring the characteristic of the electronic component 12. The measuring terminal 17 has an arm 19 having the measuring piece 18 abutting on the external electrode 11 on one end; a spindle 25 capable of supporting the other end of the arm 10, adjusting it at an optional angle, and holding it; and a lifting mechanism for moving the spindle 25 up and down. After adjusting the measuring piece 18 at a fixed angle by the spindle 25, the measuring piece 18 is allowed to abut on the ridged parts 11g, 11h of the electronic component 12, and then the characteristics are measured. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008175670(A) 申请公布日期 2008.07.31
申请号 JP20070008813 申请日期 2007.01.18
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SHIMOMURA MOTOO;YAMADA YUICHI;NISHIHARA KAZUNARI
分类号 G01R31/00;G01R31/26 主分类号 G01R31/00
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