发明名称 Method for Manufacturing Phase Shift Mask Using Electron Beam Lithography
摘要 Disclosed herein is a method for manufacturing a phase shift mask. An embodiment of the disclosed method includes forming a conductive layer on a mask substrate, irradiating a predetermined area of the mask substrate on which the conductive layer is formed with an electron beam, etching the predetermined area, and removing the conductive layer to form the phase shift mask.
申请公布号 US2008182182(A1) 申请公布日期 2008.07.31
申请号 US20070965371 申请日期 2007.12.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JO SANG JIN;JUNG HO YONG
分类号 G03F1/00 主分类号 G03F1/00
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