发明名称 ULTRASONIC PROBE FOR HIGH-TEMPERATURE APPLICATION
摘要 PROBLEM TO BE SOLVED: To precisely perform various inspections, such as flaw detection and thickness measurement using ultrasonic waves against an object 38 to be inspected in a high-temperature application. SOLUTION: A signal terminal 24 is provided on the outer surface of a case 21, formed of a conductive material having an opening 2 facing the object 38 of a conductive material and contains a vibrator 28 in the case 21; positive electrode side spring member 30, the over end of which is electrically connected to the side of a positive electrode 33 of the signal terminal 24 and the other end of which contacts the upper surface of the vibrator 28 to urge the vibrator 28 to the object 38; and a negative electrode side spring member 35 one end of which is fixed to the case 21 and the other end of which contacts the object 38 are provided; and the use of solder with a melting point temperature, in the range from 230 to 240°C is eliminated, and thus, the object in high-temperature application can be performed. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008175781(A) 申请公布日期 2008.07.31
申请号 JP20070011772 申请日期 2007.01.22
申请人 SAITAMA PREFECTURE;JAPAN PROBE KK 发明人 NAGAI HIROSHI;BABA HIROSHI
分类号 G01N29/04;G01B17/02;G01N29/24;H04R17/00 主分类号 G01N29/04
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