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发明名称
X-RAY INSPECTION BASED ON SCATTER DETECTION
摘要
申请公布号
EP1949139(A2)
申请公布日期
2008.07.30
申请号
EP20060846136
申请日期
2006.10.23
申请人
AMERICAN SCIENCE & ENGINEERING, INC.
发明人
ROTHSCHILD, PETER;SCHUBERT, JEFFREY;BAUKUS, WILLIAM, J.;SAPP, WILLIAM, WADE, JR.;SCHUELLER, RICHARD;CALLERAME, JOSEPH;CASON, WILLIAM, RANDAL
分类号
G01V5/00
主分类号
G01V5/00
代理机构
代理人
主权项
地址
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