发明名称 |
Exposure device, exposure method and method of manufacturing semiconductor device |
摘要 |
The present invention provides a highly controllable device for exposure from the back side and an exposure method, and also provides a method of manufacturing a semiconductor device using the same. The present invention involves exposure with the use of the back side exposure device of which a reflecting means is disposed on the front side of a substrate, apart from a photosensitive thin film surface by a distance X (X=0.1 mum to 1000 mum), and formation of a photosensitive thin film pattern in a self alignment manner, with good controllability, at a position a distance Y away from the end of a pattern. The invention fabricates a TFT using that method.
|
申请公布号 |
US7405432(B2) |
申请公布日期 |
2008.07.29 |
申请号 |
US20040018020 |
申请日期 |
2004.12.21 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
ADACHI HIROKI |
分类号 |
H01L27/15;G03B27/00;G03F7/00;G09G3/32;H01L21/336;H01L21/77;H01L21/84;H01L27/12 |
主分类号 |
H01L27/15 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|