发明名称 Exposure device, exposure method and method of manufacturing semiconductor device
摘要 The present invention provides a highly controllable device for exposure from the back side and an exposure method, and also provides a method of manufacturing a semiconductor device using the same. The present invention involves exposure with the use of the back side exposure device of which a reflecting means is disposed on the front side of a substrate, apart from a photosensitive thin film surface by a distance X (X=0.1 mum to 1000 mum), and formation of a photosensitive thin film pattern in a self alignment manner, with good controllability, at a position a distance Y away from the end of a pattern. The invention fabricates a TFT using that method.
申请公布号 US7405432(B2) 申请公布日期 2008.07.29
申请号 US20040018020 申请日期 2004.12.21
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 ADACHI HIROKI
分类号 H01L27/15;G03B27/00;G03F7/00;G09G3/32;H01L21/336;H01L21/77;H01L21/84;H01L27/12 主分类号 H01L27/15
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