发明名称 Asymmetric field transistors (FETs)
摘要 A semiconductor structure and a method for forming the same. The structure includes (a) a semiconductor channel region, (b) a semiconductor source block in direct physical contact with the semiconductor channel region; (c) a source contact region in direct physical contact with the semiconductor source block, wherein the source contact region comprises a first electrically conducting material, and wherein the semiconductor source block physically isolates the source contact region from the semiconductor channel region, and (d) a drain contact region in direct physical contact with the semiconductor channel region, wherein the semiconductor channel region is disposed between the semiconductor source block and the drain contact region, and wherein the drain contact region comprises a second electrically conducting material; and (e) a gate stack in direct physical contact with the semiconductor channel region.
申请公布号 US7405458(B2) 申请公布日期 2008.07.29
申请号 US20070871289 申请日期 2007.10.12
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 NOWAK EDWARD J.
分类号 H01L21/20 主分类号 H01L21/20
代理机构 代理人
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