发明名称 System and method for online end point detection for use in chemical mechanical planarization
摘要 The present invention is an online methodology for end point detection for use in a chemical mechanical planarization process which is both robust and inexpensive while overcoming some of the drawbacks of the existing end point detection approaches currently known in the art. The present invention provides a system and method for identifying a significant event in a chemical mechanical planarization process including the steps of decomposing coefficient of friction data acquired from a chemical mechanical planarization process using wavelet-based multiresolution analysis, and applying a sequential probability ratio test for variance on the decomposed data to identify a significant event in the chemical mechanical planarization process.
申请公布号 US7406396(B2) 申请公布日期 2008.07.29
申请号 US20050164048 申请日期 2005.11.08
申请人 UNIVERSITY OF SOUTH FLORIDA 发明人 DAS TAPAS K;GANESAN RAJESH;SIKDER ARUN K;KUMAR ASHOK
分类号 G06F15/00;G01N31/00 主分类号 G06F15/00
代理机构 代理人
主权项
地址