发明名称 Method of forming a gate insulator and thin film transistor incorporating the same
摘要 Disclosed herein is a method of manufacturing a gate insulator and a thin film transistor ("TFT") incorporating the gate insulator, including forming an oxygen-containing, conductive gate on a substrate; forming a gate insulator material layer on the substrate so as to cover the gate; and applying a heat treatment so as to diffuse oxygen from the oxygen-containing gate layer into the gate insulating material layer thereby forming the gate insulator.
申请公布号 US7405120(B2) 申请公布日期 2008.07.29
申请号 US20070691284 申请日期 2007.03.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE HO-NYEON;KO ICK-HWAN
分类号 H01L21/8238 主分类号 H01L21/8238
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