Signal analysis system and calibration method for measuring the impedance of a device under test

摘要

A method and apparatus adapted to calibrate a signal path of a signal analysis system such that digital samples of a signal under test acquired by the system are processed for representing the impedance of a device under test. The method and apparatus calibrates the signal path to characterize transfer parameters of the device under test within a spectral domain. A reference impedance (Z_ref) is retrieved that is associated with the signal analysis system. The transfer parameters of the device under test and the reference impedance (Z_ref) are processed to effect thereby a representation of the device under test impedance (Z_eq) as a function of frequency.