发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 A semiconductor device and a method for manufacturing the same are provided to lower hole injection efficiency from a P collector layer to an N drift layer during ON, using a high activating layer of an N buffer layer, thereby increasing turn OFF speed. A plurality of MOSFETs are formed with stripe shapes on a wafer(11). A P base layer(13) is formed on an N drift layer(12). An N+ emitter layer(14) is formed on a part of the P base layer. A gate electrode(16) is formed in a trench groove through a gate insulating layer(15). An insulating layer(17) is formed on the gate electrode. An N buffer layer(21) is formed below the wafer. A P collector layer(22) is formed below the wafer. An emitter electrode(23) is formed on the wafer. A collector electrode(24) is formed below the wafer. High and low activating parts(21a,21b) are formed with stripe shapes alternately.
申请公布号 KR20080069501(A) 申请公布日期 2008.07.28
申请号 KR20070085927 申请日期 2007.08.27
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 HAMAGUCHI TAKUYA;HARUGUCHI HIDEKI;TSUNODA TETSUJIRO
分类号 H01L21/265;H01L29/70 主分类号 H01L21/265
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