A method for manufacturing a semiconductor device is provided to improve dispersion of a turn-on current of an upper transistor and to prevent gate stringer caused by remainder due to undercut. A method for manufacturing a semiconductor device comprises the steps: forming an interlayer insulation film(110) on a semiconductor substrate(100); forming a seed plug(104) which is connected to the semiconductor substrate by penetrating the interlayer insulation film; forming a mold pattern(112a) having an opening unit(113) exposing the seed plug on the interlayer insulation film; and forming a crystallized semiconductor pattern filling the opening unit.
申请公布号
KR20080069050(A)
申请公布日期
2008.07.25
申请号
KR20070006645
申请日期
2007.01.22
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
BANG, SUK CHUL;CHUNG, EUN KUK;KIM, JOON;KIM, JIN HONG