| 摘要 |
A contact probe is provided to enhance elastic force required for a test by coupling an outer elastic unit with an outer peripheral surface of an elastic unit made of conductive rubber. A contact probe includes a plunger(10), a stopping unit(20), and an elastic unit(30). The plunger is in contact with a contact terminal of a test object. The stopping unit is extended to a lower surface of the plunger in one body. The elastic unit fixes the plunger by having a receiving groove to receive the stopping unit and is made of conductive rubber providing elasticity to the plunger. At least one projection(12) is formed at an upper part of the plunger. The projection is directly in contact with the contact terminal of the test object. |
