发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device provided with a plurality of thin-film transistors having a different threshold voltage which are fabricated by using a polycrystalline semiconductor film grown laterally in a specific direction. SOLUTION: The semiconductor device includes a first thin-film transistor fabricated by using a first crystalline semiconductor layer 14 grown laterally in a specific direction and a second thin-film transistor fabricated by using a second crystalline semiconductor layer 18 grown laterally in a specific direction. The crystal growing direction 10 of the first crystalline semiconductor layer 14 and the channel direction 15 of the first thin-film transistor form an angle of±10°or less, and the crystal growing direction 10 of the second crystalline semiconductor layer 18 and the channel direction 19 of the second thin-film transistor form an angle not less than 80°nor more than 100°. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008171951(A) |
申请公布日期 |
2008.07.24 |
申请号 |
JP20070002642 |
申请日期 |
2007.01.10 |
申请人 |
SHARP CORP |
发明人 |
TAKATO YUTAKA;KUNIYOSHI MASAAKI |
分类号 |
H01L21/336;H01L21/20;H01L29/786 |
主分类号 |
H01L21/336 |
代理机构 |
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地址 |
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