发明名称 Method And Apparatus For A Semiconductor Structure
摘要 One exemplary embodiment is a semiconductor structure, that can include a semiconductor substrate of one conductivity type, having a front surface and a back surface, a first semiconductor layer disposed on the front surface of the semiconductor substrate, a second semiconductor layer disposed on a portion of the back surface of the semiconductor substrate, and a third semiconductor layer disposed on another portion of the back surface of the semiconductor substrate. Each of the second and third semiconductor layers may be compositionally graded through its depth, from substantially intrinsic at an interface with the substrate, to substantially conductive at an opposite side, and have a selected conductivity type obtained by the incorporation of one or more selected dopants.
申请公布号 US2008173347(A1) 申请公布日期 2008.07.24
申请号 US20070625841 申请日期 2007.01.23
申请人 GENERAL ELECTRIC COMPANY 发明人 KOREVAAR BASTIAAN ARIE;JOHNSON JAMES NEIL
分类号 H01L31/036;H01L31/18 主分类号 H01L31/036
代理机构 代理人
主权项
地址
您可能感兴趣的专利