发明名称 |
PLATE GLASS DEFECT DETECTOR, PLATE GLASS MANUFACTURING METHOD, PLATE GLASS ARTICLE, PLATE GLASS QUALITY DETERMINATION DEVICE, AND PLATE GLASS INSPECTION METHOD |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To quickly, effectively and precisely detect various defects generated in an inside of a plate glass or on a surface thereof. <P>SOLUTION: This plate glass defect detector 10 is provided with a light source 20 and a photoreception device 30 arranged in opposite positions with the plate glass G therebetween. The plate glass G has translucent faces Ga, Gb opposed each other along a thickness direction thereof, and is arranged between the light source 20 and the photoreception device 30 to incline the translucent faces Ga, Gb by a prescribed angleαwith respect to an optical axis Lx of an optical system of the glass plate defect detector 10. The photoreception device 30 and the plate glass G are arranged with such a positional relationship that a focal distance F of a lens system 31 of the photoreception device 30 is smaller than a distance Z from a photoreception element of the photoreception device 30 up to the plate glass G, on the optical axis Lx. <P>COPYRIGHT: (C)2008,JPO&INPIT</p> |
申请公布号 |
JP2008170429(A) |
申请公布日期 |
2008.07.24 |
申请号 |
JP20070322074 |
申请日期 |
2007.12.13 |
申请人 |
NIPPON ELECTRIC GLASS CO LTD |
发明人 |
MINAZU HIDEMI;NISHIMURA YASUHIRO;IWATA MASAKAZU |
分类号 |
G01N21/896;G01N21/958 |
主分类号 |
G01N21/896 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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