发明名称 MASS ANALYZING SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a mass analysis system, capable of analyzing trace amounts of components contained in a sample, without having to remeasure and extend the analysis time for ions per analysis case. SOLUTION: In the tandem-type mass analyzing system, a database is searched, when the candidate of parent ions for MS<SP>2</SP>mass analysis is selected from among the peak ions of an MS<SP>1</SP>mass spectrum and the components that are not stored in the database or the component that are stored in the database but not identified in the arrangement of molecules with a predetermined number N or larger is selected as parent ions, and MS<SP>2</SP>mass analysis is performed, until a predetermined number N or larger of the rows of molecules are identified, with respect to the selected parent ions. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008170346(A) 申请公布日期 2008.07.24
申请号 JP20070004975 申请日期 2007.01.12
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 KOBAYASHI KINYA;YOKOSUKA TOSHIYUKI;YOSHINARI KIYOMI
分类号 G01N27/62 主分类号 G01N27/62
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