发明名称 Apparatus configured to position a workpiece
摘要 An apparatus is configured to position a workpiece. The apparatus includes a planar base, and a movable stage configured to support the workpiece. The stage is configured to be moved over the planar base. The apparatus also includes an actuator configured to move the stage, a contactless position measurer configured to measure a position of the stage, and a first pump configured to generate a conditioned gas flow in a volume between the measurer and the stage. The base includes a plurality of gas channels provided in the base that provide a path of the conditioned gas flow through the base.
申请公布号 US2008174750(A1) 申请公布日期 2008.07.24
申请号 US20080068071 申请日期 2008.02.01
申请人 ASML NETHERLANDS B.V. 发明人 DANSBERG MICHEL PIETER;CORNELISSEN SEBASTIAAN MARIA JOHANNES;COX HENRIKUS HERMAN MARIE;VAN DIESEN ROBERT JOHANNES PETRUS;KEMPER NICOLAAS RUDOLF;MUNNIG-SCHMIDT ROBERT-HAN;VAN DER SCHOOT HARMEN KLAAS;JANSEN ROB
分类号 G03B27/52;G03F7/20;H01L21/027 主分类号 G03B27/52
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