发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device having a SOI structure, in which an electric potential of a body region in an element-forming region isolated by a partial isolation region can be fixed with high stability. SOLUTION: A MOS transistor comprising a source region (51), a drain region (61) and an H gate electrode (71) is formed in an element forming region isolated by a partial oxide film (31). The H gate electrode (71) electrically isolates a body region (13), formed in a gate width W direction adjacent to the source region (51) and the drain region (61) from the drain region (61) and the source region (51) through "I" in a transverse direction ( vertical directions in Figure), a center "-" functions as a gate electrode of the original MOS transistor. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008172262(A) 申请公布日期 2008.07.24
申请号 JP20080027638 申请日期 2008.02.07
申请人 RENESAS TECHNOLOGY CORP 发明人 MATSUMOTO TAKUJI;MAEDA SHIGENOBU;IWAMATSU TOSHIAKI;IPPOSHI TAKASHI
分类号 H01L29/786;H01L21/76;H01L21/822;H01L21/8234;H01L21/8244;H01L27/04;H01L27/08;H01L27/088;H01L27/11 主分类号 H01L29/786
代理机构 代理人
主权项
地址