发明名称 ABNORMALITY DIAGNOSING EQUIPMENT FOR COOLER
摘要 <P>PROBLEM TO BE SOLVED: To easily diagnose abnormality of a cooler in a semiconductor power converter. <P>SOLUTION: A temperature sensor 7 detects the temperature just near a base plate within an inverter main body 2 cooled by the cooler 6. A diagnostic processor 8 gets a time rate (inclination) of temperature by a temperature detection signal detected by the temperature sensor 7 and a time signal outputted by a clock 9 after stoppage of operation of an inverter device, and diagnoses abnormality of the cooler from the magnitude of this time rate. It includes getting the time rate by stopping the cooler, getting the time rate by putting it in operation, and comparing the magnitude of both time rates. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008172938(A) 申请公布日期 2008.07.24
申请号 JP20070004084 申请日期 2007.01.12
申请人 MEIDENSHA CORP 发明人 NOSAKA KATSUNORI
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