发明名称 CHARGED PARTICLE ANALYSER SYSTEM AND METHOD
摘要 <p>A charged particle analyser system comprises at least one particle filter to which an electrostatic potential is applied when in use so as to filter charged particles received from a specimen to be analysed in accordance with their respective energies. A charged particle detector is provided for receiving the charged particles from the filter. A deflection system prevents any charged particles returning to the specimen from the particle filter.</p>
申请公布号 WO2008087386(A1) 申请公布日期 2008.07.24
申请号 WO2008GB00117 申请日期 2008.01.14
申请人 OXFORD INSTRUMENTS ANALYTICAL LIMITED;BARKSHIRE, IAN, RICHARD;STATHAM, PETER, JOHN;JACKA, MARCUS 发明人 BARKSHIRE, IAN, RICHARD;STATHAM, PETER, JOHN;JACKA, MARCUS
分类号 H01J37/244;H01J37/252;H01J37/28 主分类号 H01J37/244
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