| 摘要 |
Provided is a testing apparatus that accurately tests changes in threshold value of a transistor. The output of an operational amplifier is connected to the gate of a transistor to be tested, and the source of the transistor to be tested is negatively fed back to the negative input terminal of the operational amplifier. By applying desired voltage from a DAC to the positive input terminal of the operational amplifier, the operational amplifier operates so as to maintain a current flowing in the resistor at a constant value, thereby performing a test where the current flowing in the transistor to be tested is maintained at a constant value.
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