| 摘要 |
PROBLEM TO BE SOLVED: To allow higher speed horizontal data transfer operation in a CMOS sensor of column AD type. SOLUTION: In the solid-state imaging apparatus, column AD circuits 25 of the respective columns are provided with AD conversion parts 25b and D type flip-flops (DFF) 310. Two-input, one-output type load shift selection selector 258 is provided between the AD conversion part 25b and the DFF 310, one input is connected to output of an AD conversion part 25b of a self-column, the other output is connected to output of a DFF 310 of the other column and the solid-state imaging apparatus is constituted as shift register structure as a whole. An output driver 320 is connected to output of a DFF 310 at the head of a shift operation. After transferring data from the AD conversion part 25b to the DFF 310 of the self-column, the shift operation is performed by transferring data from a DFF 310 of the other column to the DFF 310 of the self-column, the data are output to a horizontal signal line 18 via an output driver 320 and are transferred to an output circuit 28. COPYRIGHT: (C)2008,JPO&INPIT
|
