发明名称 Defective memory block remapping method and system, and memory device and processor-based system using same
摘要 A non-volatile memory device includes a block remapping system that offsets an input block address by the addresses of non-functional blocks to provide an output block address that is used to address the memory device. The system generates the output block addresses by, in effect, adding to the input block address the addresses of all non-functional blocks of memory that are between an initial address and the output block address. The system performs this function be comparing the input block address to the address of any defective block. If the address of the defective block is less than or equal to the input block address, the addresses of all defective blocks starting at the block address are added to the input block address. The system then iteratively performs this process using each output block address generated by the system in place of the input block address.
申请公布号 US2008177933(A1) 申请公布日期 2008.07.24
申请号 US20070656577 申请日期 2007.01.22
申请人 MICRON TECHNOLOGY, INC. 发明人 NOBUNAGA DEAN;LI HANQING
分类号 G06F12/06;G06F12/02 主分类号 G06F12/06
代理机构 代理人
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