发明名称 TRACE INSPECTION SYSTEM AND CONTROL METHOD THEREOF
摘要 A trace inspection system and a control method thereof are provided to analyze the characteristic of a trace and perform trace inspection according to the index of brightness. A test inspection system includes an image generating unit(10) and an image processing unit(30). The image generating unit photographs a trace of a panel(3). The image processing unit processes an image of the trace. The image generating unit includes a camera(14) and a signal processing module. The image processing unit includes a main controller. The camera photographs the trace at the upper portion of a barrel(12) having an object glass. The main controller controls the conveyance of an inspection table(2).
申请公布号 KR100847740(B1) 申请公布日期 2008.07.23
申请号 KR20080009912 申请日期 2008.01.31
申请人 GLOBALLINK CO., LTD. 发明人 LEE, EUN PYO;KIM, YONG JIN;KIM, SE HWAN;JO, HAE JONG
分类号 G01N21/88;G01B11/00 主分类号 G01N21/88
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