发明名称 |
TRACE INSPECTION SYSTEM AND CONTROL METHOD THEREOF |
摘要 |
A trace inspection system and a control method thereof are provided to analyze the characteristic of a trace and perform trace inspection according to the index of brightness. A test inspection system includes an image generating unit(10) and an image processing unit(30). The image generating unit photographs a trace of a panel(3). The image processing unit processes an image of the trace. The image generating unit includes a camera(14) and a signal processing module. The image processing unit includes a main controller. The camera photographs the trace at the upper portion of a barrel(12) having an object glass. The main controller controls the conveyance of an inspection table(2).
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申请公布号 |
KR100847740(B1) |
申请公布日期 |
2008.07.23 |
申请号 |
KR20080009912 |
申请日期 |
2008.01.31 |
申请人 |
GLOBALLINK CO., LTD. |
发明人 |
LEE, EUN PYO;KIM, YONG JIN;KIM, SE HWAN;JO, HAE JONG |
分类号 |
G01N21/88;G01B11/00 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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