发明名称 |
Predicting Relative Humidity Sensitivity of Developer Materials |
摘要 |
A method of predicting a Lewis acid-base relative humidity (RH) ratio in a two-component developer comprised of at least a toner and a carrier including selecting a candidate toner, selecting a candidate carrier, and determining the Lewis acid and Lewis base constants for the candidate toner and candidate carrier. In addition, calculating the Lewis acid-base RH ratio wherein the calculated Lewis acid-base RH ratio is related to a charge RH ratio.
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申请公布号 |
EP1947517(A2) |
申请公布日期 |
2008.07.23 |
申请号 |
EP20080150307 |
申请日期 |
2008.01.16 |
申请人 |
XEROX CORPORATION |
发明人 |
VEREGIN, RICHARD P N.;MCDOUGALL, MARIA N V.;HAWKINS, MICHAEL S.;VONG, CUONG;SKOROKHOD, VLADISLAV |
分类号 |
G03G9/08;G03G9/097 |
主分类号 |
G03G9/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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