发明名称 Multi-step photomask etching with chlorine for uniformity control
摘要 <p>Methods for etching quartz are provided herein. In one embodiment, a method of etching quartz includes providing a film stack on a substrate support disposed in a processing chamber, the film stack having a quartz layer partially exposed through a patterned layer; and etching the quartz layer of the film stack in a multi-step process including a first step of etching the quartz layer utilizing a first process gas comprising at least one fluorocarbon process gas and a chlorine-containing process gas; and a second step of etching the quartz layer utilizing a second process gas comprising at least one fluorocarbon process gas.</p>
申请公布号 EP1947508(A1) 申请公布日期 2008.07.23
申请号 EP20070122837 申请日期 2007.12.11
申请人 APPLIED MATERIALS, INC. 发明人 KOCH, RENEE;ANDERSON, SCOTT A.
分类号 G03F1/00 主分类号 G03F1/00
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