发明名称 Method and apparatus for characterizing computer system workloads
摘要 One embodiment of the present invention provides a system that characterizes computer system workloads. During operation, the system collects metrics for a number of workloads of interest as the workloads of interest execute on a computer system. Next, the system uses the collected metrics to build a statistical regression model, wherein the statistical regression model uses a performance indicator as a response, and uses the metrics as predictors. The system then defines a distance metric between workloads, wherein the distance between two workloads is a function of the differences between metric values for the two workloads. Furthermore, these differences are weighted by corresponding coefficients for the metric values in the statistical regression model.
申请公布号 US7401012(B1) 申请公布日期 2008.07.15
申请号 US20050111152 申请日期 2005.04.20
申请人 SUN MICROSYSTEMS, INC. 发明人 BONEBAKKER JAN L.;GLUHOVSKY ILYA
分类号 G06F17/50;G06F9/45;G06F15/173;G06F15/177 主分类号 G06F17/50
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