发明名称 Manufacturing method of semiconductor device
摘要 There is here disclosed a manufacturing method of a semiconductor device, comprising providing a first film by a PVD process in a recess formed in at least one insulating film, the first film containing at least one metal element belonging to any one of the groups 4 -A, 5 -A, and 6 -A, continuously providing a second film by at least one of CVD and ALD processes on the first film without opening to atmosphere, the second film containing at least one metal element belonging to any one of the groups 4 -A, 5 -A, and 6 -A, continuously providing a third film by the PVD process on the second film without opening to the atmosphere, the third film containing at least one metal element belonging to any one of the groups 4 -A, 5 -A, and 6 -A, continuously providing a first Cu film on the third film without opening to the atmosphere, and heating the Cu film.
申请公布号 US7399706(B2) 申请公布日期 2008.07.15
申请号 US20050041362 申请日期 2005.01.25
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 OMOTO SEIICHI;KATATA TOMIO;HIGASHI KAZUYUKI;YAMAGUCHI HITOMI;EZAWA HIROKAZU;SAKATA ATSUKO
分类号 H01L21/28;H01L21/44;H01L21/00;H01L21/3205;H01L21/4763;H01L21/768;H01L23/52;H01L23/522;H01L23/532;H01L29/76;H01L31/062;H01L31/119 主分类号 H01L21/28
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