MANUFACTURING METHOD OF LOW-K THIN FILMS AND AFTER ANNEALING PROCESSES USING RTA, LOW-K THIN FILMS MANUFACTURED THEREFROM

摘要

Plasma polymerized low-k thin films with considerably low dielectric constant values are provided, and treatment methods are provided to improve dielectric constants and mechanical strengths of the low-k thin films. A manufacturing method of a low-k thin film comprises the steps of: depositing a plasma polymerized thin film onto a substrate(1) by a plasma enhanced chemical vapor deposition process using a polymer precursor material; and performing a post-heat treatment at a temperature of 300 to 550 deg.C and a pressure of 0.5 to 1.5 atmospheric pressure in a gas atmosphere containing oxygen gas or nitrogen gas for 1 to 5 minutes by using an RTA(Rapid Thermal Annealing) apparatus. The polymer precursor material is decamethylcyclopentasiloxane or cyclohexane. The step of performing the post-heat treatment comprises injecting the substrate into a chamber(70) of the RTA apparatus, and generating heat relative to the substrate by using a plurality of halogen lamps(80) disposed within the chamber.