| 摘要 |
A device and a method for measuring and quantifying waviness of sheet materials such as paper. The device in accordance with one embodiment comprises a base having a planar, smooth, and level upper surface for supporting a stack of sheets thereon, a plate-shaped weight for placing atop the stack of sheets, and a measuring device for measuring a vertical distance between a datum surface defined by the weight and a datum surface defined by the base. The measured distance is an indication of the height of the stack. In a preferred embodiment, the device also includes a programmed processor operable to calculate a "Wavy Ratio" based on the measured actual height H of the stack and a calculated "ideal" height of the stack, as Wavy Ratio = H / (n · t), where n is the number of sheets and t is the average caliper of the sheets.
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