发明名称 |
TEST BOARD OF MULTILAYER TYPE FOR HIGH-PRECISION INSPECTION |
摘要 |
A stacked test board for high-precision inspection is provided to enhance safety and reliability of inspection by minimizing or shielding the effect of electrical signals using a signal shield fence. A stacked test board for high-precision inspection includes plural test boards(10), spacers(20), connection cables(30), and signal shield fences(40). The test boards include plural mounting components mounted on a side thereof and input/output signal terminals at the end portions thereof. The spacers are used for arranging constantly the test boards by separating the test boards. The connection cables are positioned between the input/output signal terminals. The signal shield fences are formed up to constant height so as to prevent interference of electrical signals between mounting components on the test boards.
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申请公布号 |
KR20080064250(A) |
申请公布日期 |
2008.07.09 |
申请号 |
KR20070000933 |
申请日期 |
2007.01.04 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, MIN GU;AN, YOUNG SOO;CHOI, HO JEONG;KIM, JUNG HYEON |
分类号 |
H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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