发明名称 PATTERN FORMING PROCESS FOR SEMICONDUCTOR DEVICE
摘要 <p>A method for forming patterns of semiconductor devices is provided to form effectively micro patterns by performing a rinse process on a photosensitive film pattern using liquids with a low surface tension. In a method for forming patterns of semiconductor devices to coat water-soluble materials on photosensitive film patterns, a surface of the photosensitive film patterns(115) is rinsed using a composition(120) having polymer and water before coating the water-soluble materials on the photosensitive film patterns. The composition includes compounds of 0.0001 to 5 weight percent and water of the rest of weight percent. The water-soluble materials are RELACS(Resolution Enhancement Lithography Assisted by Chemical Shrink) materials(117).</p>
申请公布号 KR20080064458(A) 申请公布日期 2008.07.09
申请号 KR20070001408 申请日期 2007.01.05
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, TAE HUAN;LEE, SUNG KOO
分类号 H01L21/027 主分类号 H01L21/027
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