发明名称 |
PATTERN FORMING PROCESS FOR SEMICONDUCTOR DEVICE |
摘要 |
<p>A method for forming patterns of semiconductor devices is provided to form effectively micro patterns by performing a rinse process on a photosensitive film pattern using liquids with a low surface tension. In a method for forming patterns of semiconductor devices to coat water-soluble materials on photosensitive film patterns, a surface of the photosensitive film patterns(115) is rinsed using a composition(120) having polymer and water before coating the water-soluble materials on the photosensitive film patterns. The composition includes compounds of 0.0001 to 5 weight percent and water of the rest of weight percent. The water-soluble materials are RELACS(Resolution Enhancement Lithography Assisted by Chemical Shrink) materials(117).</p> |
申请公布号 |
KR20080064458(A) |
申请公布日期 |
2008.07.09 |
申请号 |
KR20070001408 |
申请日期 |
2007.01.05 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, TAE HUAN;LEE, SUNG KOO |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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