PROBE CONTACT FOR TEST SOCKET AND TEST SOCKET INCLUDING THE SAME

摘要

A probe contactor for a test socket and the test socket including the same are provided to reduce a manufacturing cost by shortening a whole height of the test socket. A probe contactor for a test socket is formed in a tubular with a mesh structure or a porous structure. A contact portion of the tubular contacted with an electrode of a semiconductor chip package is opened. A diameter of the tubular is less than the electrode of the semiconductor chip package. The probe contactor(10) is contacted to a contact member which wires are contacted to each other at a middle portion of the tubular with respect to a length direction of the tubular.