发明名称 Method of forming a MOS transistor
摘要 A method of forming a MOS transistor, in which a co-implantation is performed to implant an implant into a source region and a drain region or a halo implanted region to effectively prevent dopants from over diffusion in the source region and the drain region or the halo implanted region, for obtaining a good junction profile and improving short channel effect. The implant comprises carbon, a hydrocarbon, or a derivative of the hydrocarbon, such as one selected from a group consisting of C, Chd xH<SUB>y</SUB><SUP>+</SUP>, and (C<SUB>x</SUB>H<SUB>y</SUB>)<SUB>n</SUB><SUP>+</SUP>, wherein x is a number of 1 to 10, y is a number of 4 to 20, and n is a number of 1 to 1000.
申请公布号 US7396717(B2) 申请公布日期 2008.07.08
申请号 US20060278434 申请日期 2006.04.03
申请人 UNITED MICROELECTRONICS CORP. 发明人 WANG HSIANG-YING;CHIEN CHIN-CHENG;HSIAO TSAI-FU;CHIEN MING-YEN;CHEN CHAO-CHUN
分类号 H01L21/8238 主分类号 H01L21/8238
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