发明名称 Low temperature epitaxial growth of silicon-containing films using UV radiation
摘要 A method of preparing a clean substrate surface for blanket or selective epitaxial deposition of silicon-containing and/or germanium-containing films. In addition, a method of growing the silicon-containing and/or germanium-containing films, where both the substrate cleaning method and the film growth method are carried out at a temperature below 750° C., and typically at a temperature from about 700° C. to about 500° C. The cleaning method and the film growth method employ the use of radiation having a wavelength ranging from about 310 nm to about 120 nm in the processing volume in which the silicon-containing film is grown. Use of this radiation in combination with particular partial pressure ranges for the reactive cleaning or film-forming component species enable the substrate cleaning and epitaxial film growth at temperatures below those previously known in the industry.
申请公布号 US7396743(B2) 申请公布日期 2008.07.08
申请号 US20040866471 申请日期 2004.06.10
申请人 发明人 SINGH KAUSHAL K.;CARLSON DAVID;HEMKAR MANISH;KUPPURAO SATHEESH;THAKUR RANDHIR
分类号 H01L21/20;C30B1/00;G01R31/26;H01L21/205;H01L21/36;H01L21/66 主分类号 H01L21/20
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