发明名称 Barrier dielectric stack for seam protection
摘要 The present invention provides a semiconducting device including a gate dielectric atop a semiconducting substrate, the semiconducting substrate containing source and drain regions adjacent the gate dielectric; a gate conductor atop the gate dielectric; a conformal dielectric passivation stack positioned on at least the gate conductor sidewalls, the conformal dielectric passivation stack comprising a plurality of conformal dielectric layers, wherein no electrical path extends entirely through the stack; and a contact to the source and drain regions, wherein the discontinuous seam through the conformal dielectric passivation stack substantially eliminates shorting between the contact and the gate conductor. The present invention also provides a method for forming the above-described semiconducting device.
申请公布号 US7397073(B2) 申请公布日期 2008.07.08
申请号 US20040904661 申请日期 2004.11.22
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ENGEL BRETT H.;LUCARINI STEPHEN M.;SYLVESTRI JOHN D.;WANG YUN-YU
分类号 H01L29/76 主分类号 H01L29/76
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