发明名称 CIRCUIT ANALYSIS METHOD, CIRCUIT ANALYSIS PROGRAM, AND CIRCUIT SIMULATION DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce the circuit area of a semiconductor device to be designed. SOLUTION: A circuit simulation device 10 includes: a delay time verifying part 252 for calculating a delay time T<SB>d</SB>under a prescribed environmental condition concerning static timing verification with respect to a logical circuit 100 after layout, and performing hold verification; and a layout correcting part 253. When hold violation is determined in the hold verification, the delay time verifying part 252 selects a correcting method corresponding to the environmental condition from the plurality of layout correcting methods. The layout correcting part 253 corrects the layout of the logical circuit with the use of the correcting method selected by the delay time verifying part. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008152329(A) 申请公布日期 2008.07.03
申请号 JP20060336703 申请日期 2006.12.14
申请人 NEC ELECTRONICS CORP 发明人 UEDA HIROTAKA
分类号 G06F17/50;H01L21/82 主分类号 G06F17/50
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