| 摘要 |
PROBLEM TO BE SOLVED: To prevent the generation of the defect of the function of a semiconductor chip since a current which flows by electrostatic discharge generated at the time of the assembly of the semiconductor chip is discharged via a fuse element. SOLUTION: A semiconductor chip 1 comprises at least one fuse element 21, a fuse opening 17 provided on the fuse element 21, and a discharge electrode 31 arranged under the bottom 17a of the fuse opening 17 and on the same level as or over the fuse element 21. COPYRIGHT: (C)2008,JPO&INPIT |
