发明名称 Column address enable signal generation circuit for semiconductor memory device
摘要 A semiconductor memory device includes a clock period detector, a column address enable signal generator, and a multiplexing circuit. The clock period detector detects a period of an external clock in response to a pulse width information signal having a pulse width corresponding to that of the external clock. The column address enable signal generator generates a column address enable signal activated in response to a column access signal. The multiplexing circuit multiplexes points of time of inactivation of the column access signal in response to the detected signal outputted from the clock period detector.
申请公布号 US2008159057(A1) 申请公布日期 2008.07.03
申请号 US20070819948 申请日期 2007.06.29
申请人 KIM BO-YEUN 发明人 KIM BO-YEUN
分类号 G11C8/18 主分类号 G11C8/18
代理机构 代理人
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