发明名称 THE PHOTO MASK AND METHOD FOR MANUFACTURING THE SAME, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME
摘要 <p>An exposure mask is provided to avoid a side lobe phenomenon by a destructive interference caused by a phase difference between a contact hole pattern and its adjacent contact hole pattern by forming an exposure mask using a strong phase shift mask having a phase difference of 180 degrees between the contact hole pattern and its adjacent contact hole pattern. A mask pattern(300) is formed on a transparent substrate(305) to define a plurality of island-type light transmitting patterns. The light transmitting patterns include a first light transmitting region(310) and a second light transmitting region(320) separated from the first light transmitting region by a predetermined distance wherein the first and second light transmitting regions have a phase difference of 180 degrees. The first and second light transmitting regions can alternately be formed.</p>
申请公布号 KR20080061848(A) 申请公布日期 2008.07.03
申请号 KR20060136993 申请日期 2006.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 EOM, TAE SEUNG
分类号 H01L21/027 主分类号 H01L21/027
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