| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing apparatus being reduced in cost by simplifying the whole structure of circuits and scaling the size down. SOLUTION: The semiconductor testing apparatus 100 brings a selection circuit 114 to select address information generated by respective arithmetic circuits 111, 112 and 113, outputs it to a DUT 150 and designates an address of a memory section to be tested, and furthermore, outputs the address information to a selection circuit 121 via a branched connection line and selects one from these address information sets other than the address information selected by the selection circuit 114 and outputs it to a pattern memory 122, and then outputs a test pattern stored at an address designated by the address information to the DUT 150 from the pattern memory 122, thereby carrying out a functional operation test. COPYRIGHT: (C)2008,JPO&INPIT
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