发明名称 Semiconductor device and method for fabricating the same
摘要 A semiconductor device has a MIM capacitor including a first insulating film formed on a semiconductor substrate, a lower electrode composed of a first metal film formed on the first insulating film, a capacitor insulating film formed on the lower electrode, and an upper electrode composed of a second metal film formed on the capacitor insulating film. The semiconductor device further has a lower interconnect composed of the first metal film formed on the first insulating film and an upper interconnect composed of the second metal film formed on the lower interconnect. The upper interconnect and the upper electrode are formed integrally.
申请公布号 US2008158775(A1) 申请公布日期 2008.07.03
申请号 US20080071742 申请日期 2008.02.26
申请人 MATSUSHITA ELECTRIC CO., LTD. 发明人 SEO SATOSHI;UEDA TETSUYA;TSUTSUE MAKOTO
分类号 H01G4/228;H01L21/20 主分类号 H01G4/228
代理机构 代理人
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