发明名称 |
MEMORY DIAGNOSIS APPARATUS |
摘要 |
an in-word test means for testing coupling faults between the bits within a word on a word-by-word basis in a memory; an inter word test means for testing coupling faults between the words within a partial array for each partial array consisting of a plurality of words in the memory; and an inter block test means for testing coupling faults between the partial arrays in the memory. The memory diagnosis apparatus can perform a quick coupling fault diagnosis while maintaining the diagnostic accuracy at a certain level.
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申请公布号 |
KR20080063407(A) |
申请公布日期 |
2008.07.03 |
申请号 |
KR20087011725 |
申请日期 |
2006.09.20 |
申请人 |
MITSUBISHI ELECTRIC CORPORATION |
发明人 |
KANAMARU HIROO;ISHIOKA TAKUYA |
分类号 |
G11C29/00 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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