发明名称 MEMORY DIAGNOSIS APPARATUS
摘要 an in-word test means for testing coupling faults between the bits within a word on a word-by-word basis in a memory; an inter word test means for testing coupling faults between the words within a partial array for each partial array consisting of a plurality of words in the memory; and an inter block test means for testing coupling faults between the partial arrays in the memory. The memory diagnosis apparatus can perform a quick coupling fault diagnosis while maintaining the diagnostic accuracy at a certain level.
申请公布号 KR20080063407(A) 申请公布日期 2008.07.03
申请号 KR20087011725 申请日期 2006.09.20
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 KANAMARU HIROO;ISHIOKA TAKUYA
分类号 G11C29/00 主分类号 G11C29/00
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