发明名称 Method for forming metal pattern and method for forming gate electrode in semiconductor device using the same
摘要 A method for forming a metal pattern in a semiconductor device includes forming an etch stop layer over a semi-finished substrate including a metal layer, forming a hard mask over the etch stop layer, etching the hard mask to form a hard mask pattern exposing the etch stop layer, and etching the etch stop layer and the metal layer using the hard mask pattern.
申请公布号 US2008160737(A1) 申请公布日期 2008.07.03
申请号 US20070824024 申请日期 2007.06.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 OH SANG-ROK;YU JAE-SEON
分类号 H01L21/3205;H01L21/311 主分类号 H01L21/3205
代理机构 代理人
主权项
地址