发明名称 Phase-change memory and fabrication method thereof
摘要 A phase-change memory and fabrication method thereof. The phase-change memory comprises a transistor, and a phase-change material layer. In particular, the phase-change material layer is directly in contact with one electrical terminal of the transistor. Particularly, the transistor can be a field effect transistor or a bipolar junction transistor.
申请公布号 US2008157050(A1) 申请公布日期 2008.07.03
申请号 US20060617977 申请日期 2006.12.29
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE;POWERCHIP SEMICONDUCTOR CORP.;NANYA TECHNOLOGY CORPORATION;PROMOS TECHNOLOGIES INC.;WINBOND ELECTRONICS CORP. 发明人 CHEN FREDERICK T
分类号 H01L29/04;G11C11/00;H01L21/306 主分类号 H01L29/04
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