发明名称 Semiconductor component, particularly gate structure, has gate isolation layer, electrode on gate isolation layer, intermediate structure on electrode and another electrode on intermediate structure
摘要 The semiconductor component has a substrate with an upper side and a lower side. A gate structure is close to the upper side of the substrate, where the gate structure has a gate isolation layer, an electrode on the gate isolation layer, an intermediate structure on the electrode and another electrode on the intermediate structure. The intermediate structure has a titanium layer is titanium silicide layer containing titanium, and on the titanium layer has another tungsten layer, which is tungsten silicide layer, containing tungsten and silicon. An independent claim is also included for a method for producing gate structure for a semiconductor component.
申请公布号 DE102007030321(A1) 申请公布日期 2008.07.03
申请号 DE20071030321 申请日期 2007.06.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SUNG, MIN-GYU;YANG, HONG-SEON;CHO, HEUNG-JAE;KIM, YONG-SOO;LIM, KWAN-YONG
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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