发明名称 Wafer level package with die receiving through-hole and method of the same
摘要 The present invention discloses a structure of package comprising: a substrate with a die receiving through holes, a conductive connecting through holes structure and coupled a first contact pad on the upper surface of the substrate and a second contact pads on lower surface of the substrate; at least a die with metal pads disposed within the die receiving through holes; a surrounding material formed under the die and filled in the gap between the sidewall of die and sidewall of the die receiving though holes; a re-distribution layer (RDL) formed on the die, substrate and surrounding material; and coupled the metal pads of the die to the first contact pad; an isolating base having adhesion material formed over the RDL.
申请公布号 US2008157358(A1) 申请公布日期 2008.07.03
申请号 US20070979015 申请日期 2007.10.30
申请人 ADVANCED CHIP ENGINEERING TECHNOLOGY INC. 发明人 YANG WEN-KUN
分类号 H01L23/48;H01L21/00 主分类号 H01L23/48
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