发明名称 Non-volatile memory device including metal-insulator transition material
摘要 A non-volatile memory device including a metal-insulator transition (MIT) material is provided. The non-volatile memory device includes a gate stack having a tunneling layer, a charge trap layer, a blocking layer and a gate electrode formed on a substrate, wherein at least one of the tunneling layer and the blocking layer is formed of an MIT (metal-insulator transition) material.
申请公布号 US2008157186(A1) 申请公布日期 2008.07.03
申请号 US20070980352 申请日期 2007.10.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK WAN-JUN;LEE JO-WON;JEON SANG-HUN;KIM CHUNG-WOO
分类号 H01L29/792 主分类号 H01L29/792
代理机构 代理人
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