发明名称 MULTI-FREQUENCY IMAGE PROCESSING FOR INSPECTING PARTS HAVING COMPLEX GEOMETRIC SHAPES
摘要 A method for detecting small cracks and other anomalies on parts having complex geometries is disclosed. The method includes eddy current inspection incorporating collection of data from multi-frequency eddy current signals. Phase analysis is used to combine the multi-frequency data to enhance the signal to noise ratio of the raw inspection image. The image is then reprocessed using a spatiotemporal filter to correlate with the frequency components of the eddy current flaw signal to separate signals associated with cracks and other flaws at edges that would ordinarily be hidden by edge effect signals.
申请公布号 US2008159619(A1) 申请公布日期 2008.07.03
申请号 US20060617859 申请日期 2006.12.29
申请人 GENERAL ELECTRIC COMPANY 发明人 SUH UI WON;GAMBRELL GIGI OLIVE;MCKNIGHT WILLIAM STEWART;PISUPATI PREETI;MISHRA PEYUSH KUMAR;DEWANGAN SANDEEP KUMAR;WANG CHANGTING
分类号 G06K9/00 主分类号 G06K9/00
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