| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device capable of high-accuracy measurement of electrical characteristics of an analog part provided in a semiconductor integrated circuit device for short time, without having to depend on the tester ability of a logic tester, and the like. SOLUTION: When DC test for an analog front end part 2, provided in the semiconductor integrated circuit device, is performed by a tester LT, the measurement result output from the analog circuit via an optional switch of a switching part 10 is inputted to a sample and hold circuit 11. The measurement result is converted into digital data via an A/D converter 13, then the digital date is inputted to an expected value determining section 14. The expected value determining section 14 determines the input expected value of the digital data, and the determined result is outputted to the tester LT. COPYRIGHT: (C)2008,JPO&INPIT
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